A new optical material 4-chloro -N- methyl 4-stilbazolium tosylate, a new derivative of the stilbazolium tosylate family has been synthesized and transparent single crystals were grown by slow solvent evaporation technique. The grown crystals were tested for structural and electrical characterization such as single, powder and high resolution X-ray diffraction and dielectric measurements. The crystal system and lattice parameters were found from single crystal X-ray diffraction. Crystalline perfection has been found using X-ray rocking curve. Formations of defects were analyzed from etching studies. The dielectric constant, dielectric loss and dielectric impedance as a function of frequency and temperature were studied from the LCZ analysis.